(Click here if you need control charts for variables)

This wizard computes the Lower and Upper Control Limits (LCL, UCL) and the Center Line (CL) for monitoring the fraction of nonconforming items or number of nonconformities (defects) using *p* and *c* control charts .

The limits are based on taking a set of preliminary samples drawn while the process is known to be in control. The information from these samples is used to estimate the sample fraction nonconforming (*p*) or the number of nonconformities in a sample unit (*c*).